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en:aree:microscopia:elettronica:start [2019/05/22 20:16] Gianluca Frustagli |
en:aree:microscopia:elettronica:start [2019/06/18 14:58] Gianluca Frustagli |
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* Instruments for the sample preparation: Critical Point Drying, Sputtering, Vacuum Evaporator. | * Instruments for the sample preparation: Critical Point Drying, Sputtering, Vacuum Evaporator. | ||
+ | </WRAP> | ||
+ | |||
+ | \\ | ||
+ | |||
+ | <WRAP box> | ||
+ | ==== History ==== | ||
+ | |||
+ | //The electron microscopy service is offered thanks to a shared management agreement between the <wrap em>FAST</wrap> and the <wrap em>FARVA</wrap>, <wrap em>MEGE</wrap> and <wrap em>TISP</wrap> centers. In all these structures there are in fact human resources and knowledge coming from the historical area of electron microscopy. The agreement safeguards a cultural heritage that has been present in the Institute for years, allows the advancement of the electron microscopy sector and facilitates the optimization of resources.// | ||
</WRAP> | </WRAP> | ||
/* > FIXME **To be revised.**\\ //(remove this paragraph once finished)// */ | /* > FIXME **To be revised.**\\ //(remove this paragraph once finished)// */ |