Differences
This shows you the differences between two versions of the page.
| Both sides previous revision Previous revision Next revision | Previous revision Next revision Both sides next revision | ||
|
en:aree:microscopia:elettronica:start [2019/05/22 16:08] Gianluca Frustagli [Lab resources] |
en:aree:microscopia:elettronica:start [2019/06/18 14:58] Gianluca Frustagli |
||
|---|---|---|---|
| Line 16: | Line 16: | ||
| <WRAP justify> | <WRAP justify> | ||
| - | {{:aree:microscopia:elettronica:tem.jpeg?200 |}} <wrap em bigger>Transmission Electron Microscopy (TEM)</wrap> allows to obtain high resolution images by high energy transmitted electrons from an ultrathin (<100nm) and adequately contrasted sample. | + | {{:aree:microscopia:elettronica:tem.jpeg?200 |}} <wrap em>Transmission Electron Microscopy (TEM)</wrap> allows to obtain high resolution images by high energy transmitted electrons from an ultrathin (<100nm) and adequately contrasted sample. |
| TEM service is equipped with: | TEM service is equipped with: | ||
| Line 24: | Line 24: | ||
| * **Ultramicrotome LEICA UC6** for sectioning of samples embedded in epoxy and acrylic resins. | * **Ultramicrotome LEICA UC6** for sectioning of samples embedded in epoxy and acrylic resins. | ||
| - | \\ \\ \\ \\ \\ \\ \\ \\ \\ | + | \\ \\ \\ \\ \\ \\ \\ \\ |
| - | {{ :aree:microscopia:elettronica:sem.jpeg?300|}} <wrap em bigger>Field Emission Scanning Electron Microscopy (FE-SEM)</wrap> allows to obtain high resolution three dimensional images from an adequately treated sample. A very high collimated electron beam interacts with a conductive sample scanning an area from which it induces the emission of secondary electrons. \\ These are collected to produce a such high focal depth image to permit detailed analysis of the morphological features of the region of interest. | + | {{ :aree:microscopia:elettronica:sem.jpeg?300|}} <wrap em>Field Emission Scanning Electron Microscopy (FE-SEM)</wrap> allows to obtain high resolution three dimensional images from an adequately treated sample. A very high collimated electron beam interacts with a conductive sample scanning an area from which it induces the emission of secondary electrons. \\ These are collected to produce a such high focal depth image to permit detailed analysis of the morphological features of the region of interest. |
| - | + | ||
| - | \\ | + | |
| SEM service is equipped with: | SEM service is equipped with: | ||
| Line 36: | Line 34: | ||
| </WRAP> | </WRAP> | ||
| + | |||
| + | \\ | ||
| + | |||
| + | <WRAP box> | ||
| + | ==== History ==== | ||
| + | |||
| + | //The electron microscopy service is offered thanks to a shared management agreement between the <wrap em>FAST</wrap> and the <wrap em>FARVA</wrap>, <wrap em>MEGE</wrap> and <wrap em>TISP</wrap> centers. In all these structures there are in fact human resources and knowledge coming from the historical area of electron microscopy. The agreement safeguards a cultural heritage that has been present in the Institute for years, allows the advancement of the electron microscopy sector and facilitates the optimization of resources.// | ||
| + | </WRAP> | ||
| + | |||
| + | /* > FIXME **To be revised.**\\ //(remove this paragraph once finished)// */ | ||
